Abstract and keywords
Abstract (English):
The results of an experiment to determine the activation energy of a deep level in a gallium arsenide mesastructure by capacitive relaxation spectroscopy of deep levels at various values of the blocking voltage are considered.

Keywords:
deep-level transient spectroscopy, DLTS, frequency scan
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References

1. Lang D.V. Deep Level Transient Spectroscopy: A new method to characterize traps in semiconductors / D. V. Lang // Proc. of 9th World Congress on Railway Research, May 2011.

2. Krylov, V.P. Kompleksnoe modelirovanie fizicheskih processov i apparatnyh preobrazovaniy v relaksacionnoy spektroskopii glubokih urovney / Krylov V.P., Bogachev A.M., Pronin T.Yu., Mischenko A.A. // SAPR i modelirovanie v sovremennoy elektronike: sb. nauch. tr. I Mezhdunar. nauch.-prak. konf. (Bryansk, 22-23 noyabrya 2017 g.) / pod red. L.A. Potapova, A.Yu. Drakina. - Bryansk: BGTU, 2017. - S. 9 - 11.

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