%0 Conference Article
%T DEEP LEVELS' ACTIVATION ENERGY DEPENDENCE  ON MEASUREMENT MODES
%A Bogachev, A.M.
%A Krylov, V.P.
%K deep-level transient spectroscopy, DLTS, frequency scan
%J CAD/EDA/SIMULATION IN MODERN ELECTRONICS 2019
%D 2024
%P 2
%I Bryansk State Technical University