Abstract and keywords
Abstract (English):
There is stated a choice of a technological mode for diamond abrasion ensuring a required process capacity and silicon carbide plate quality. The correlations of a silicon carbide removal rate with the length of surface micro-cracks with the roughness height of a surface are stated. A procedure is offered for setting technological modes which do not result in plate billet destruction during manufacturing special devices.

diamond abrasion capacity, micro-cracks, surface roughness, silicon carbide plates
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