Abstract and keywords
Abstract (English):
The problems of model creating for nonlinear gate-drain capacitance of MOSFET are considered. A circuit is proposed for measuring this capacitance in the region of negative drain-gate voltages. The dependence of the gate-drain capacitance on voltage for the IRF540N transistor is constructed and an approximating function that can be used to create a model of a MOS-transistor is proposed.

Keywords:
MOSFET, gate-drain capacitance, measuring RLC bridge, exponential function
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References

1. Konyushenko, I. Osnovy ustroystva i primeneniya silovyh MOP-tranzistorov (MOSFET) // Silovaya elektronika. - 2011. - № 2. -S. 10-14.

2. Amelin, S.A. Raznovidnosti SPICE-modeley tranzistorov s izolirovannym zatvorom/ S.A. Amelin, M.A. Amelina //Energetika, informatika, innovacii - 2017: sb. trudov VII-oy Mezhd. nauch.-tehn. konf.: v 3 t. T. 2. - S. 15-20.

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