TY  CONF
TI  MULTISCAN IDENTIFICATION OF MODELS OF PHYSICAL PROCESSES OF RELAXATION OF CAPACITY OF SEMICONDUCTOR BARRIER STRUCTURES
KW  
JO  CAD/EDA/Simulation in Modern Electronics
AU  Krylov, V.P.
AU  Bogachev, A.M.
AU  Pronin, T.Y.
AU  Mischenko, A.A.
PY  2024
PB  Bryansk State Technical University