%0 Journal Article
%T APPLYING SCANNING ELECTRON MICROSCOPY IN REVERSE ENGINEERING OF ELECTRONIC COMPONENT BASE
%A Malakhanov, A.A.
%A Pugachev, A.A.
%A Markova, V.K.
%K scanning electron microscopy, section, gate dielectric, busbar, dustiness coefficient, reverse engineering
%J Automation and modeling in design and management
%D 2024
%N 2024
%P 8
%I Bryansk State Technical University